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All books by this authorYoon Jon-do et al.

Yoon Jon-do et al.: Scanning electron microscopy analysis and X-ray microanalysis

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Description

A group of experts in scanning electron microsynthesis and X-ray microanalysis have been working on the development and spread of electronic microscoping technology. One, five, and six. Chapter 8 is about X-ray microanalysis, chapter 9 is about the drill and vacuum. The study of materials and materials, including materials, microstructuring, internal structure, surface structure, building blocks, ingredients, elements, impurities, and other things, is filled with material, including natural minerals, fibers, biology, biology and chemistry, physics, physics and environment. It may also help environmental officials who monitor the quality and defects of the components and analyze the possible cause of destruction, such as water asbestos, and so on.

Korean title: 주사전자현미경 분석과 X선 미세분석

Korean author: 윤존도 외

Korean publisher: 교문사

ISBN-13: 9788936320751

윤존도 외: 주사전자현미경 분석과 X선 미세분석

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